Chernoff, Donald: search on Z-Library

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1

Multilaboratory comparison of traceable atomic force microscope measurements of a 70-nm grating pitch standard

Chernoff, Donald A.

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2011

Language:

english

File:

PDF, 762 KB

english, 2011

2

Traceable pitch metrology: supporting the development of patterned media and more

Chernoff, Donald A.

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2012

Language:

english

File:

PDF, 3.87 MB

english, 2012

3

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Metrology, Inspection, and Process Control for Microlithography XXII - Picometer-scale accuracy in pitch metrology by optical diffraction and atomic force microscopy

Chernoff, Donald A., Allgair, John A., Raymond, Christopher J., Buhr, Egbert, Burkhead, David L., Diener, Alexander

Year:

2008

Language:

english

File:

PDF, 784 KB

english, 2008

4

Comment on “fluorescence from an upper singlet of aromatic c-nitroso compounds”

Donald A. Chernoff, Robin M. Hochstrasser

Journal:

Chemical Physics Letters

Year:

1980

Language:

english

File:

PDF, 181 KB

english, 1980

5

Single vibronic level fluoresence from aniline

Chernoff, Donald A., Rice, Stuart A.

Journal:

The Journal of Chemical Physics

Year:

1979

Language:

english

File:

PDF, 1.02 MB

english, 1979

6

SPIE Proceedings [SPIE SPIE's 1995 Symposium on Microlithography - Santa Clara, CA (Sunday 19 February 1995)] Integrated Circuit Metrology, Inspection, and Process Control IX - Atomic force microscope (AFM) analysis of photoresist test structures for use in SEM as in-house linewidth standards

Chernoff, Donald A., Bennett, Marylyn H.

Year:

1995

Language:

english

File:

PDF, 1.01 MB

english, 1995

7

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Metrology, Inspection, and Process Control for Microlithography XIII - Automated high-precision measurement of critical dimensions using the scanning probe microscope

Chernoff, Donald A., Burkhead, David L., Singh, Bhanwar

Year:

1999

Language:

english

File:

PDF, 1.99 MB

english, 1999

8

Prioritizing candidate reproductive/developmental toxicants for evaluation

Donald, James M., Monserrat, Laurie E., Hooper, Kim, Book, Steven A., Chernoff, Gerald F.

Journal:

Reproductive Toxicology

Year:

1992

Language:

english

File:

PDF, 764 KB

english, 1992

9

Influenza Vaccination of Human Immunodeficiency Virus (HIV)‐Infected Adults: Impact on Plasma Levels of HIV Type 1 RNA and Determinants of Antibody Response

Fuller, Jon D., Craven, Donald E., Steger, Kathleen A., Cox, Nancy, Heeren, Timothy C., Chernoff, David

Journal:

Clinical Infectious Diseases

Year:

1999

Language:

english

File:

PDF, 118 KB

english, 1999

10

ChemInform Abstract: COENZYM B12-MODELLUNTERSUCHUNGEN, GLEICHGEWICHTE UND KINETIK DES AXIALEN LIGANDENAUSTAUSCHES VON METHYLAQUOCOBALOXIM DURCH PRIM. ALIPHATISCHE AMINE UND 4-SUBSTITUIERTE PYRIDINE

BROWN, KENNETH L., CHERNOFF, DONALD, KELJO, DAVID J., KALLEN, ROLAND G.

Journal:

Chemischer Informationsdienst

Year:

1972

File:

PDF, 100 KB

1972

11

Resurrecting dirty atomic force microscopy calibration standards

Chernoff, Donald A., Sherman, Robert

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2010

Language:

english

File:

PDF, 820 KB

english, 2010

12

Atomic force microscope imaging for process characterization in diamond film deposition

Chernoff, Donald A.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1992

Language:

english

File:

PDF, 1.02 MB

english, 1992

13

SPIE Proceedings [SPIE Microlithography '97 - Santa Clara, CA (Monday 10 March 1997)] Metrology, Inspection, and Process Control for Microlithography XI - High-precision calibration of a scanning probe microscope (SPM) for pitch and overlay measurements

Chernoff, Donald A., Lohr, Jason D., Hansen, Douglas P., Lines, Michael, Jones, Susan K.

Year:

1997

Language:

english

File:

PDF, 848 KB

english, 1997

14

Influenza Vaccination of Human Immunodeficiency Virus (HIV)-Infected Adults: Impact on Plasma Levels of HIV Type 1 RNA and Determinants of Antibody Response

Jon D. Fuller, Donald E. Craven, Kathleen A. Steger, Nancy Cox, Timothy C. Heeren and David Chernoff

Journal:

Clinical Infectious Diseases

Year:

1999

Language:

english

File:

PDF, 375 KB

english, 1999

15

Collision induced intramolecular vibrational energy transfer in 1B2 aniline

Chernoff, Donald A., Rice, Stuart A.

Journal:

The Journal of Chemical Physics

Year:

1979

Language:

english

File:

PDF, 1.73 MB

english, 1979

16

Chemistry of exciplexes. 9. Viscosity effect on intramolecular exciplex formation in saturated hydrocarbons

Yang, Nein-Chu C., Neoh, Soon Bin, Naito, Takeaki, Ng, Lay-Keow, Chernoff, Donald A., McDonald, Daniel B.

Journal:

Journal of the American Chemical Society

Year:

1980

Language:

english

File:

PDF, 598 KB

english, 1980

17

Scanning force microscopy; with applications to electric, magnetic, and atomic forces: By Dror Sarid. Oxford University Press, New York, 1991. xi + 254 pp. $45

Donald A. Chernoff

Journal:

Journal of Solid State Chemistry

Year:

1992

Language:

english

File:

PDF, 198 KB

english, 1992

18

Discussion: Consistent Nonparametric Regression

Peter J. Bickel, Leo Breiman, David R. Brillinger, H. D. Brunk, Donald A. Pierce, Herman Chernoff, Thomas M. Cover, D. R. Cox, William F. Eddy, Frank Hampel, Richard A. Olshen, Emanuel Parzen, M. Rose

Journal:

The Annals of Statistics

Year:

1977

Language:

english

File:

PDF, 1.76 MB

english, 1977

19

SPIE Proceedings [SPIE Optical Data Storage - Whistler, BC, Canada (Sunday 14 May 2000)] Optical Data Storage 2000 - Automated analysis of data mark microstructure of various media in the optical disk industry

Cook, Candi S., Chernoff, Donald A., Burkhead, David L., Stinson, Douglas G., Katayama, Ryuichi

Year:

2000

Language:

english

File:

PDF, 339 KB

english, 2000

20

Classroom Notes

Pedoe, Daniel, McAllister, B. L., Chernoff, P. R., Watson, Donald, Sheng, T. K., Haruki, Hiroshi, Hill, Paul, Virga, M. R., Machover, M., Wolfenstein, S., Fefferman, Charles

Journal:

American Mathematical Monthly

Year:

1967

Language:

english

File:

PDF, 1022 KB

english, 1967

21

The structure of electronic excited states in trans-stilbene: Picosecond transient Stokes and anti-Stokes Raman spectra

Gustafson, Terry L., Roberts, Dale M., Chernoff, Donald A.

Journal:

The Journal of Chemical Physics

Year:

1984

Language:

english

File:

PDF, 711 KB

english, 1984

22

Long-lived high energy vibrational levels in benzene vapor

Chernoff, Donald A., Myers, James D., Pruett, J. Gary

Journal:

The Journal of Chemical Physics

Year:

1986

Language:

english

File:

PDF, 451 KB

english, 1986

23

SPIE Proceedings [SPIE Scanning Microscopy 2010 - Monterey, California (Monday 17 May 2010)] Scanning Microscopy 2010 - Interlaboratory comparison of traceable atomic force microscope pitch measurements

Dixson, Ronald, Postek, Michael T., Newbury, Dale E., Chernoff, Donald A., Wang, Shihua, Platek, S. Frank, Joy, David C., Vorburger, Theodore V., Tan, Siew Leng, Orji, Ndubuisi G., Fu, Joseph

Year:

2010

Language:

english

File:

PDF, 2.48 MB

english, 2010

24

Coenzyme B12 model studies. Equilibriums and kinetics of axial ligation of methylaquocobaloxime by primary amines and 4-substituted pyridines

Brown, Kenneth L., Chernoff, Donald, Keljo, David J., Kallen, Roland G.

Journal:

Journal of the American Chemical Society

Year:

1972

Language:

english

File:

PDF, 994 KB

english, 1972

25

Automated, high precision measurement of critical dimensions using the atomic force microscope

Chernoff, Donald A., Burkhead, David L.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

1999

Language:

english

File:

PDF, 591 KB

english, 1999

26

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Metrology, Inspection, and Process Control for Microlithography XXIV - Roadmap for traceable calibration of a 5-nm pitch length standard

Chernoff, Donald A., Raymond, Christopher J., Burkhead, David L.

Year:

2010

Language:

english

File:

PDF, 725 KB

english, 2010

27

Letters to the Editors

Homer Jacobson, Rory Barnes, Sean Raymond, Donald B. Aulenbach, Johan E. Vos, Paul R. Chernoff, Theodore C. Doege and Charlie A. Crutchfield

Journal:

American Scientist

Year:

2007

Language:

english

File:

PDF, 915 KB

english, 2007

28

SPIE Proceedings [SPIE Microlithography '97 - Santa Clara, CA (Monday 10 March 1997)] Metrology, Inspection, and Process Control for Microlithography XI - Unique approach to high-performance magnification calibration

Hansen, Douglas P., Lines, Michael, Chernoff, Donald A., Lohr, Jason D., Jones, Susan K.

Year:

1997

Language:

english

File:

PDF, 551 KB

english, 1997

29

SPIE Proceedings [SPIE Optical Data Storage - Santa Fe, NM (Sunday 22 April 2001)] Optical Data Storage 2001 - AFM length analysis of data marks: measuring jitter, asymmetry, process noise, and process position

Chernoff, Donald A., Burkhead, David L., Hurst, Terril, Kobayashi, Seiji

Year:

2002

Language:

english

File:

PDF, 64 KB

english, 2002

30

Immunologic Studies of Hemoglobins

RUCKNAGEL, DONALD L., CHERNOFF, AMOZ I.

Journal:

Year:

1955

File:

PDF, 918 KB

1955

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